Commodity Description:
VISUAL INSPECTION and TAPING EQUIPMENT, SUITABLE TO USE TO
MEASURE and INSPECT SEMICONDUCTOR WAFERS, N.O.S.

Effective	09JUN2016
Filed	09JUN2016
Filing Codes	C

TLIs (Listed By Origin/Destination):

San Francisco, CA, United States

Penang, Malaysia (ALL) (0002) (06/09/2016)

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